PRODUCTS
- Home
- Products
- 3D Morphology
- 3D Surface Topography Measurement Platform
3D Morphology
3D Surface Topography Measurement Platform
- Features
- Non-Contact, High-Precision 3D Surface Profiling
- Wide field of view and high-efficiency scanning capability
- Compatible with various materials and surface conditions
- Comprehensive topography and surface feature analysis functions
- Modular hardware/software architecture with open expansion interfaces
- High stability design with strong vibration resistance
- Broad applicability across diverse industrial and research fields
3D Surface Topography Measurement Platform
Color Confocal Single-Point Thickness and Warpage Measurement Technology

- Applicable to Glass and Silicon Substrates
- Thickness measurement range: up to 0.7 mm
- Measurement accuracy: < 2 μm; repeatability: < 2 μm
- Supports multi-point thickness distribution and warpage inspection


iboson 3D Surface Analysis System



Non-Contact 3D Surface Reconstruction Technology
- Capable of analyzing both glossy and matte surfaces
- Enables high-precision dimensional analysis
- Supports multi-layer thickness measurement
- Allows evaluation of surface flatness and assembly tolerances


