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Thermography - Precision Micro-Area Thermal Imaging

The ThermalView X MCR series includes both hardware and software functions, correction, and calibration required for micro-area measurements. After installing a detector with sufficient sensitivity to capture a small area and an optical system sufficient for resolution, correction and dedicated calibration are performed to solve errors peculiar to the small area. In addition, there is a dedicated function on the GUI so that the user can make corrections according to the situation. The ThermalView X MCR series is the latest microscope thermography for manufacturers of advanced semiconductors and new products such as wafer patterns, material structures, micro heating sources, light-emitting devices, micro-encapsulants, and micro-components and materials.
Micron-level resolution can be resolved from 7.5 microns (uncooled) and 2 microns (cooled).