Defect Detection
Luminance Analysis


Capture the entire chip in one shot to accelerate testing speed. Image luminance calibration is applied.
Capable of measuring luminance uniformity.
Ultra-high resolution for detecting dead pixels, bright lines, etc.
High resolution exceeding 30 million pixels.
Brightness compensation for obtaining the luminance of each individual pixel.

Demura Technology Concept:
Using the self-developed image luminance meter by iboson Technology.
The image is captured and compensated through the developed software.
This process transforms it into the required IC demura table.

 

 

Introduction to MicroLED Inspection Solutions by iboson

Image Luminance Product Specifications

Camera Resolution:

9344*7000px,65MP

6464*4852px,31.4MP

2448*2048px, 5MP
support customized lens 16mm/25mm/50mm/microscope lens. Brightness range: 0.1~2,000nits with high brightness range.

影像輝度產品

Pixel coordinates positioning

Position calculations are developed for different pixel arrangement types, and multiple types of panels can be supported.

Pixel 坐標定位

Full-frame imagery

Automatically determine the exposure time to avoid over-dimming or over-exposure of local areas

Automatically detect the correct measurement area, search for the edge of the bright area, and automatically exclude the non-bright area for analysis

軟件功能

Software function - image capture

Adjust the skewed part of the rotated image to avoid problems caused by alignment skew and improve positioning accuracy.

The pixel glow measurement function finds each subpixel and calculates the corresponding brightness value.

Support various subpixel arrangement settings, pixel position definition, and multiple subpixels.

像素輝度量測

Defect detection function

  • Find the subpixel over-bright/under-dark point (set the brightness value or the average of the whole area)
  • You can set the arrangement type for different subpixels.
  • The over-bright/over-dark thresholds can be set for different subpixels.
  • Luminous pixel area analysis
  • Pixel color resolution.
  • Large-area defect detection.
  • Pixels in different color positions are the same bright.
  • LED Misplanted Judgment.
檢測缺陷功能

Flag the shortcomings

Large areas of continuous pixel shortcomings can be scratched.

B. The shortcomings of the rounded edge can be scratched out.

Brightness anomalies can be picked out (too bright or too dark).

發光像素分析
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