Flat field, Glare
iboson Tech offers an optical measurement system for assessing the characteristics of CMOS image sensors. Through our proprietary development of Quantum Efficiency Testing System, Flat Field Correction, and Glare Testing System, we provide a comprehensive optical measurement solution for CMOS image sensors.
The key features include: Quantum Efficiency Testing System: Measures CMOS quantum efficiency and Chief Ray Angle (CRA). Flat Field Correction and Glare Testing System: Implements flat field correction and lens glare testing.
Quantum Efficiency Testing System:
Adjustable wavelength light source, Spot size > 25mm.
Luminous flux > 1mW@nm.
Full Width at Half Maximum (FWHM) = 5 ~ 10nm.
Wavelength Range: 380 ~ 1100nm.
Light uniformity > 95%
Flat Field Correction and Glare Testing System
Focal Length = 25mm.
Field of View = 23.3° x 31.7° @ 1.1"sensor.
Maximum Aperture Diameter: 100mm.
Z-axis height adjustment range: 200mm.